IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)
October 14 – 16, 2025
Denver, CO
PAINE 2024 Winners
Best Paper
Towards reducing costs of side channel analysis for real-time algorithm detection
Kevin Pintong, Douglas Summerville
Binghamton University
Best Lab Demo
Security and Assurance (SCAN) Lab – University of Florida
Director: Dr. Navid Asadi
Manager: Nitin Varshney
Video 1
VR Link
University of Florida
Best Poster
Applying a Trusted Microelectronics Post-Silicon Verification &Validation Workflow to legacy integrated Circuit Design Recovery
Jon Scholl, Noah Padro, Yash Patel, Tim McDonley, Adam R.Waite, John Kelley, Christian Eakins, Tamara Juntiff, Adam Kimura
Battelle Memorial Institute – Air Force Research Laborator