IEEE International Conference on PHYSICAL ASSURANCE and INSPECTION of ELECTRONICS (PAINE)

October 14 – 16, 2025
Denver, CO

PAINE 2024 Winners

Best Paper
Towards reducing costs of side channel analysis for real-time algorithm detection

Kevin Pintong, Douglas Summerville
Binghamton University

Best Lab Demo

Security and Assurance (SCAN) Lab – University of Florida
Director: Dr. Navid Asadi
Manager: Nitin Varshney
Video 1
VR Link 
University of Florida

Best Poster

Applying a Trusted Microelectronics Post-Silicon Verification &Validation Workflow to legacy integrated Circuit Design Recovery
Jon Scholl, Noah Padro, Yash Patel, Tim McDonley, Adam R.Waite, John Kelley, Christian Eakins, Tamara Juntiff, Adam Kimura
Battelle Memorial Institute – Air Force Research Laborator