“All Times are in CST”
Day1(October 25, 2022)
07:40
|
08:40
Registration and Breakfast
08:40
|
08:55
Opening remarks – PAINE 2022 Awards
General Chair and Program Chair
Plenary Session I
Chair: Dr. Nick Hooten – Invariant Corporation
08:55
|
09:35
Keynote Talk I: The Future of Collaboration Across
Boundaries in Microelectronics
Dr. Donna Joyce – Army
09:35
|
09:55
Break
SESSION I: Paper Presentations
Chair: Dr. Biswajit Ray – The University of Alabama in Huntsville
09:55
|
10:15
Beware of Discarding Used SRAMs: Information is
Stored Permanently for PCB-Level Hardware Trojan
Detection using Capacitive Sensor
Joshua Hovanes -Auburn University
10:15
|
10:35
EM-Fault It Yourself: Building a Replicable EMFI Setup
for Desktop and Server Hardware
Niclas Kuhnapfel – Technical University of Berlin
10:35
|
10:55
An End-to-End Marking Recognition System for PCB
Optical Inspection
Shajib Ghosh – University of Florida
10:55
|
11:15
Break
SESSION II: Invited Talk
Chair: Dr. Adam Kimura – Battelle
11:15
|
11:35
Parts Management Guidance Advanced Packaged
Electronics
Jeffrey Jarvis – Army DEVCOM AvMC Parts Reliability
11:35
|
11:55
Security assessment of non-volatile memories through
direct binary data extraction
Liu Qing – Temasek Laboratories, Nanyang Technological University
11:55
|
13:30
Lunch and Exhibit
SESSION III: PANEL DISCUSSION
Moderator: Dr. Waleed Khalil – Ohio State University
13:30
|
15:00
The Future of PAINE: The Next Decade of Physical
Assurance
Speakers:
Dr. Richard Ott – Air Force Research Laboratory,
Nir Sever – ProteanTecs,
Dr. Adam Kimura – Battelle Memorial Institute,
Jasper Woudenberg – Riscure.
15:00
|
15:20
Break
SESSION IV: POSTER PRESENTATION
Chair: Dr. Kanad Basu – University of Texas at Dallas
17:30
|
19:30
Reception
End of Day 1
Day 2(October 26, 2022)
07:40
|
08:40
Registration and Breakfast
Plenary Session II
Chair: Dr. Bob Overbeek – Radiance Technologies
08:40
|
09:20
Keynote Talk II: Elevating Chip Fabrication Variations to
Security at Application Level
Dr. Gang Qu – NSF
09:20
|
09:40
Break
SESSION V: Paper Presentations
Chair: Dr. Kanad Basu – University of Texas at Dallas
09:40
|
10:00
Automated Transfer Learning Model for Counterfeit IC
Detection
Shajib Ghosh – University of Florida
10:00
|
10:20
Printed Circuit Board inspection: Fusion of Optical and
X-rayimages (FOXi) for electronic components
classification
Sebelan Danishvar – Brunel University
10:20
|
10:40
Automated Structure Matching of Printed Circuit Boards
Calvin Hirsch – Two Six Technologies
10:40
|
11:00
Break
SESSION VI: Invited Talk
Chair: Dr. white Paul D. Hale – NIST
11:00
|
11:20
Machine Vision based Total Assurance: Traceability and
Conformance from wafer to package to PCB.
Dr. Naresh Menon– Chromologic
11:20
|
11:40
Mixed Signal Approach to IP Protection and
Obfuscation
Dr. Nima Maghari– University of Florida
11:40
|
12:00
Heterogeneous Integration Challenges and
Opportunities in 5G / 6G era
Dr. Yong-Kyu Yoon – University of Florida
12:00
|
13:15
Lunch and Exhibit
SESSION VII: PANEL DISCUSSION
Moderator: Dr. Aydin Aysu – North Carolina State University
13:15
|
14:45
Secure Packaging: Initiatives, Research, and Workforce
Development
Panelists:
Dr. Madhavan Swaminathan – Georgia Institute of Technology,
Dr. Gang Qu – NSF,
Peter O’Donnell – Army CCDC,
Saverio Fazzari – Booz Allen Hamilton ,
Dr. Charlie Hudnall – The University of Southern Mississippi
14:45
|
15:15
Break
SESSION VIII: Invited Talk
Chair: Dr. Mehdi Sadi – Auburn University
15:15
|
15:35
Modeling and Simulation of Cyber Physical Systems for
Cybersecurity Research
Dr. Tommy Morris– University of Alabama in Huntsville
15:35
|
15:55
Hardware & Supply Chain Assurance: Challenges and
Advantages of Automation
Beau Bakken – Caspia Technologies
15:55
|
16:15
Heterogeneous Integration / Challenges with CHIPS Act
Sultan Lilani – Integra Technologies
16:15
|
16:35
Break
SESSION IX: Paper Presentations
Chair: Gregory Fritz – Draper
16:35
|
16:55
Single Image Printed Circuit Board Functional Similarity
Clustering using Vision Transformers
Dr. Alex Fafard – – Two Six Technologies
16:55
|
17:15
Timing Camouflage Enabled State Machine Obfuscation
Michaela Brunner – -Technical University of Munich
17:15
|
17:35
PCBA Image Analysis: A Comparison Of Visible, Infrared
& X-ray Wavelengths
Ben Malin – Brunel University London
End of Day 2
Day 3(October 27, 2022)
07:20
|
08:20
Registration and Breakfast
SESSION X: Invited Talk
Chair: Allen Krell – Invariant
08:20
|
08:40
Muli-Modal Non-Destructive Evaluation with Digital
Tomosynthesis 3D X-ray to reduce counterfeit ingress
and increase batch sampling via faster throughput
Andy Barnes – Adaptix Ltd
08:40
|
09:00
Accelerating High Resolution X-ray Tomography of Large
PCBs
Jeff Gelb – Sigray, Inc.
09:00
|
09:20
Deeper Scan – A rapid solution for (counterfeit) device
identification and the detection of device tampering,
utilising X-ray imagery
Jay Richards – NWPRO
09:20
|
09:40
Break
SESSION XI: Paper Presentations
Chair: Dr. Heath Berry – Radiance Technologies
09:40
|
10:00
Ferroelectric Materials: Enabling Programmable Process
Control Monitors
Rashmi Jha – University of Cincinnati
10:00
|
10:20
Utilization of Impedance Disparity Incurred from
Switching Activities to Monitor and Characterize
Firmware Activities
Md Sadik Awal – Florida International University
10:20
|
10:40
Towards PCB Netlist Extraction from Multimodal
Imagery
Anthony George – Battelle Memorial Institute
10:40
|
11:00
Break
SESSION XII: Paper Presentations
Chair: Dr. Adam Waite – Battelle
11:00
|
11:20
Unsupervised Domain Adaptation with Histogram-gated
Image Translation for Delayered IC Image Analysis
Yee-Yang Tee – Nanyang Technological University
11:20
|
11:40
Target preparation methodology for semi-invasive
attacks on microcontrollers
Rodrigo Silva Lima – ALPhANOV – Mines Saint-Etienne
11:40
|
12:00
Automated Stitching of Noisy Scanning Electron
Microscopy Images for Integrated Circuit Reverse
Engineering
Michael Pucher – University of Vienna
12:00
|
12:20
VeriGene: A Tool for the Creation of DNA
Representations for Hardware Security Analysis
Nicholas Haehn – University of Cincinnati
12:20
|
13:30
Lunch and “University Labs Virtual Tour”
University Participants:
The University of Alabama in Huntsville
University of Florida
Nanyang Technological University – Singapore
Brunel university – London
North Carolina State University
Auburn University
Centre Microélectronique Provence – France
13:30
|
13:45
Lunch