IEEE International Conference
on PHYSICAL ASSURANCE and
INSPECTION of ELECTRONICS (PAINE)
PAINE 2022 Winners
Best Paper
Beware of Discarding Used SRAMs: Information is Stored Permanently
Joshua Hovanes, Yadi, Zhong, Ujjwal Guin
Auburn University
Best Lab Demo
National integrated Center for Evaluation (NiCE) Lab
Director: Chee Lip Gan
Manager: Liu Qing
Video 1 Video 2
Nanyang Technological University – Singapore
Best Poster
Total ionizing Dose Effects on SRAM Power-up State
Umeshwarnath Surendranathan, Horace Wilson, Maryla Wasiolek, Khalid Hattar, Aleksandar Milenkovic, and Biswajit Ray
University of Alabama in Huntsville – Sandia National Laboratories