IEEE International Conference
on PHYSICAL ASSURANCE and
INSPECTION of ELECTRONICS (PAINE)

PAINE 2022 Winners

Best Paper
Beware of Discarding Used SRAMs: Information is Stored Permanently

Joshua Hovanes, Yadi, Zhong, Ujjwal Guin
Auburn University

Best Lab Demo

National integrated Center for Evaluation (NiCE) Lab
Director: Chee Lip Gan
Manager: Liu Qing
Video 1     Video 2
Nanyang Technological University – Singapore

Best Poster

Total ionizing Dose Effects on SRAM Power-up State
Umeshwarnath Surendranathan, Horace Wilson, Maryla Wasiolek, Khalid Hattar, Aleksandar Milenkovic, and Biswajit Ray
University of Alabama in Huntsville – Sandia National Laboratories